NCP170AMX330GEVB: Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board

The NCP170AMX330GEVB evaluation board is designed to quickly test the NCP170, a series of CMOS low dropout regulators are designed specifically for portable battery-powered applications which require ultra-low quiescent current. The ultra-low consumption of type 500nA ensures long battery life and dynamic transient boost feature improves device transient response for wireless communication applications.

评估/开发工具信息
产品状况Compliance简短说明所用产品
NCP170AMX330GEVBActivePb-freeUltra Low IQ 150mA CMOS LDO Regulator Evaluation BoardNCP170BMX330TCG
技术文档
类型文档标题文档编号/大小修订号
Eval Board: BOMNCP170AMX330GEVB Bill of Materials ROHS CompliantNCP170AMX330GEVB_BOM_ROHS.pdf - 15 KB0
Eval Board: GerberNCP170AMX330GEVB Gerber Layout Files (Zip Format)NCP170AMX330GEVB_GERBER.zip - 37 KB0
Eval Board: SchematicNCP170AMX330GEVB SchematicNCP170AMX330GEVB_SCHEMATIC.pdf - 50 KB0
Eval Board: Test ProcedureNCP170AMX330GEVB Test ProcedureNCP170AMX330GEVB_TEST_PROCEDURE.pdf - 36 KB0
VideoUltra‐Low IQ 150 mA CMOS LDO Regulator Evaluation Boards - NCP170WVD17574/D
NCP170AMX330GEVB BOM ROHS NCP170AMX330GEVB
NCP170AMX330GEVB GERBER NCP170AMX330GEVB
NCP170AMX330GEVB SCHEMATIC NCP170AMX330GEVB
NCP170AMX330GEVB TEST PROCEDURE NCP170AMX330GEVB