NCP170AMX330GEVB: Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board
The NCP170AMX330GEVB evaluation board is designed to quickly test the NCP170, a series of CMOS low dropout regulators are designed specifically for portable battery-powered applications which require ultra-low quiescent current. The ultra-low consumption of type 500nA ensures long battery life and dynamic transient boost feature improves device transient response for wireless communication applications.
评估/开发工具信息
| 产品 | 状况 | Compliance | 简短说明 | 所用产品 |
|---|---|---|---|---|
| NCP170AMX330GEVB | Active | Pb-free | Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board | NCP170BMX330TCG |
技术文档
| 类型 | 文档标题 | 文档编号/大小 | 修订号 |
|---|---|---|---|
| Eval Board: BOM | NCP170AMX330GEVB Bill of Materials ROHS Compliant | NCP170AMX330GEVB_BOM_ROHS.pdf - 15 KB | 0 |
| Eval Board: Gerber | NCP170AMX330GEVB Gerber Layout Files (Zip Format) | NCP170AMX330GEVB_GERBER.zip - 37 KB | 0 |
| Eval Board: Schematic | NCP170AMX330GEVB Schematic | NCP170AMX330GEVB_SCHEMATIC.pdf - 50 KB | 0 |
| Eval Board: Test Procedure | NCP170AMX330GEVB Test Procedure | NCP170AMX330GEVB_TEST_PROCEDURE.pdf - 36 KB | 0 |
| Video | Ultra‐Low IQ 150 mA CMOS LDO Regulator Evaluation Boards - NCP170 | WVD17574/D |
- NCP170AMX330GEVB BOM ROHS NCP170AMX330GEVB
- NCP170AMX330GEVB GERBER NCP170AMX330GEVB
- NCP170AMX330GEVB SCHEMATIC NCP170AMX330GEVB
- NCP170AMX330GEVB TEST PROCEDURE NCP170AMX330GEVB
