The NCP333FCT2GEVB evaluation board is designed to test the NCP333, a low Ron MOSFET controlled by an external logic pin, allowing optimization of battery life, and portable device autonomy.
产品 | 状况 | Compliance | 简短说明 | 所用产品 |
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NCP333FCT2GEVB | Active | Pb-free | Load Switch with Discharge Path, 1.5A | NCP333FCT2G |
类型 | 文档标题 | 文档编号/大小 | 修订号 |
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Eval Board: BOM | NCP333FCT2GEVB Bill of Materials ROHS Compliant | NCP333FCT2GEVB_BOM_ROHS.pdf - 23 KB | 0 |
Eval Board: Gerber | NCP333FCT2GEVB Gerber Layout Files (Zip Format) | NCP333FCT2GEVB_GERBER.zip - 48 KB | 0 |
Eval Board: Schematic | NCP333FCT2GEVB Schematic | NCP333FCT2GEVB_SCHEMATIC.pdf - 10 KB | 0 |
Eval Board: Test Procedure | NCP333FCT2GEVB Test Procedure | NCP333FCT2GEVB_TEST_PROCEDURE.pdf - 6 KB | 0 |