
The NCP334FCT2GEVB evaluation board is designed to quickly test the NCP334, a very low Ron MOSFETs controlled by an external logic pin, allowing optimization of battery life, and portable device autonomy.
| 产品 | 状况 | Compliance | 简短说明 | 所用产品 |
|---|---|---|---|---|
| NCP334FCT2GEVB | Active | Pb-free | 2.0 A Controlled Load Switch with Auto-Discharge Path Evaluation Board | NCP334FCT2G |
| 类型 | 文档标题 | 文档编号/大小 | 修订号 |
|---|---|---|---|
| Eval Board: BOM | NCP334FCT2GEVB Bill of Materials ROHS Compliant | NCP334FCT2GEVB_BOM_ROHS.pdf - 72 KB | 0 |
| Eval Board: Gerber | NCP334FCT2GEVB Gerber Layout Files (Zip Format) | NCP334FCT2GEVB_GERBER.zip - 43 KB | 0 |
| Eval Board: Schematic | NCP334FCT2GEVB Schematic | NCP334FCT2GEVB_SCHEMATIC.pdf - 15 KB | 0 |
| Eval Board: Test Procedure | NCP334FCT2GEVB Test Procedure | NCP334FCT2GEVB_TEST_PROCEDURE.pdf - 11 KB | 0 |