HMC517-Die Low Noise Amplifier Chip, 17 - 26 GHz

The HMC517 chip is a high dynamic range GaAs PHEMT MMIC Low Noise Amplifier (LNA) which covers the 17 to 26 GHz frequency range. The HMC517 provides 19 dB of small signal gain, 2.2 dB of noise figure and has an output IP3 greater than +24 dBm. The chip can easily be integrated into hybrid or MCM assemblies due to its small size. All data is tested with the chip in a 50 Ohm test fixture connected via 0.075mm (3 mil) ribbon bonds of minimal length 0.31 mm (12 mil). Two 0.025 mm (1 mil) diameter bondwires may also be used to make the RFIN and RFOUT connections.

Applications

Features and Benefits
  • Noise Figure: 2.2 dB
  • Gain: 19 dB
  • OIP3: +24 dBm
  • Single Supply: +3V @ 65 mA
  • 50 Ohm Matched Input/Output
  • Die Size: 2.14 x 1.32 x 0.1 mm
  • Amplifiers
    S-Parameters
    Data Sheets
    Documentnote
    HMC517 Die Data SheetPDF 602.71 K
    Application Notes
    Documentnote
    AN-1363: Meeting Biasing Requirements of Externally Biased RF/Microwave Amplifiers with Active Bias Controllers (Rev. 0)PDF 804.11 K
    MMIC Amplifier Biasing Procedure Application NotePDF 435.1 K
    Broadband Biasing of Amplifiers General Application NotePDF 433.77 K
    Thermal Management for Surface Mount Components General Application NotePDF 189.99 K
    Order Information
    Part NumberPackagePacking QtyTemp RangePrice 100-499Price 1000+RoHS
    HMC517 ProductionCHIPS OR DIEOTH 25-55 to 85C34.0427.57Y
    HMC517-SX ProductionCHIPS OR DIEOTH 2-40 to 85C00Y
    Reference Materials
    HMC517 Die Data Sheet hmc517-die
    HMC517 Die S-Parameters hmc517-die
    AN-1363: 利用有源偏置控制器满足外部偏置射频/微波放大器的偏置要求 (Rev. 0) hmc8120
    AN-1363: Meeting Biasing Requirements of Externally Biased RF/Microwave Amplifiers with Active Bias Controllers (Rev. 0) hmc8120
    MMIC Amplifier Biasing Procedure Application Note hmc1049lp5e
    Broadband Biasing of Amplifiers General Application Note hmc1049lp5e
    Thermal Management for Surface Mount Components General Application Note hmc1049lp5e
    Semiconductor Qualification Test Report: PHEMT-A (QTR: 2013-00267) hmc263lp4e