HMC519-Die Low Noise Amplifier Chip, 18 - 32 GHz

The HMC519 chip is a high dynamic range GaAs PHEMT MMIC Low Noise Amplifier (LNA) which covers the 18 to 32 GHz frequency range. The HMC519 provides 15 dB of small signal gain, 2.8 dB of noise figure and has an output IP3 greater than 23 dBm. The chip can easily be integrated into hybrid or MCM assemblies due to its small size. All data is tested with the chip in a 50 Ohm test fixture connected via 0.075 mm (3 mil) ribbon bonds of minimal length 0.31 mm (12 mil). Two 0.025 mm (1 mil) diameter bondwires may also be used to make the RFIN and RFOUT connections.

Applications

Features and Benefits
  • Noise Figure: 2.8 dB
  • Gain: 15 dB
  • OIP3: 23 dBm
  • Single Supply: +3V @ 65 mA
  • 50 Ohm Matched Input/Output
  • Die Size: 2.27 x 1.32 x 0.1 mm
  • Amplifiers
    S-Parameters
    Data Sheets
    Documentnote
    HMC519 Die Data SheetsPDF 621.29 K
    Application Notes
    Documentnote
    AN-1363: Meeting Biasing Requirements of Externally Biased RF/Microwave Amplifiers with Active Bias Controllers (Rev. 0)PDF 804.11 K
    MMIC Amplifier Biasing Procedure Application NotePDF 435.1 K
    Broadband Biasing of Amplifiers General Application NotePDF 433.77 K
    Thermal Management for Surface Mount Components General Application NotePDF 189.99 K
    Order Information
    Part NumberPackagePacking QtyTemp RangePrice 100-499Price 1000+RoHS
    HMC519 ProductionCHIPS OR DIEOTH 25-55 to 85C49.2740.72Y
    HMC519-SX ProductionCHIPS OR DIEOTH 2-40 to 85C00Y
    Reference Materials
    HMC519 Die Data Sheets hmc519-die
    HMC519 Die S-Parameters hmc519-die
    AN-1363: 利用有源偏置控制器满足外部偏置射频/微波放大器的偏置要求 (Rev. 0) hmc8120
    AN-1363: Meeting Biasing Requirements of Externally Biased RF/Microwave Amplifiers with Active Bias Controllers (Rev. 0) hmc8120
    MMIC Amplifier Biasing Procedure Application Note hmc1049lp5e
    Broadband Biasing of Amplifiers General Application Note hmc1049lp5e
    Thermal Management for Surface Mount Components General Application Note hmc1049lp5e
    Semiconductor Qualification Test Report: PHEMT-A (QTR: 2013-00267) hmc263lp4e