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The HS-303CEH is an analog switch and a monolithic device that is fabricated using Intersil’s dielectrically isolated Radiation Hardened Silicon Gate (RSG) process technology to insure latch-up free operation. It is pinout compatible and functionally equivalent to the HS-303RH. This switch offers low-resistance switching performance for analog voltages up to the supply rails. ON-resistance is low and stays reasonably constant over the full range of operating voltage and current. ON-resistance also stays reasonably constant when exposed to radiation. Break-before-make switching is controlled by 5V digital inputs. The HS-303CEH can operate with rails of ±15V.

Specifications
The Detailed Electrical Specifications for the HS-303CEH is contained in SMD 5962-95813.

Key Features

• QML, per MIL-PRF-38535
• No latch-up, dielectrically isolated device islands
• Pinout and functionally compatible with Intersil HS-303RH series analog switches
• Analog signal range equal to the supply voltage range
• Low leakage: 150nA (max, post-rad)
• Low rON: 60Ω (max, post-rad)
• Low standby supply current: ±150µA (max, post-rad)
• Radiation assurance
  • High dose rate (50 to 300rad(Si)/s): 100krad(Si)
  • Low dose rate (0.01rad(Si)/s): 50krad(Si)*
• Single event effects
  • For LET = 60MeV-mg/cm2 at 60° incident angle, <150pC charge transferred to the output of an off switch * Product capability established by initial characterization. The EH version is acceptance tested on a wafer-by-wafer basis to 50krad(Si) at low dose rate.