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The ISL55100B is a Quad pin driver and window comparatorfabricated in a wide voltage CMOS process. It is designedspecifically for Test During Burn-In (TDBI) applications, wherecost, functional density and power are all at a premium.

This IC incorporates four channels of programmable driversand window comparators into a small 72 Ld QFN package.Each channel has independent driver levels, data and highimpedance control. Each receiver has dual comparators, whichprovide high and low threshold levels.

The ISL55100B uses differential mode digital inputs and cantherefore mate directly with LVDS or CML outputs.Single-ended logic families are handled by connecting one ofthe digital input pins to an appropriate threshold voltage (e.g.,1.4V for TTL compatibility). The comparator outputs aresingle-ended and the output levels are user defined to matedirectly with any digital technology.

The 18V driver output and receiver input ranges allow thisdevice to interface directly with TTL, ECL, CMOS (3V, 5V and7V), LVCMOS and custom level circuitry, as well as the highvoltage (super voltage) level required for many special testmodes for Flash Devices.

Key Features

• Low driver output resistance
  • ROUT typical: 9.0Ω
• 18V I/O range
• 50MHz operation
• 4 Channel driver/receiver pairs with per pin flexibility
• Dual level - per pin - input thresholds
• Differential or single-ended digital inputs
• User defined comparator output levels
• Low channel-to-channel timing skew
• Small footprint (72 Ld QFN)
• Pb-free (RoHS compliant)

Applications

• Burn in ATE
• Wafer level flash memory test
• LCD panel test
• Low cost ATE
• Instrumentation
• Emulation
• Device programmers