NCP170AXV250GEVB: Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board
The NCP170AXV250GEVB evaluation board is designed to quickly test the NCP170, a series of CMOS low dropout regulators are designed specifically for portable battery-powered applications which require ultra-low quiescent current. The ultra-low consumption of type 500nA ensures long battery life and dynamic transient boost feature improves device transient response for wireless communication applications.
Evaluation/Development Tool Information
| Product | Status | Compliance | Short Description | Parts Used |
|---|---|---|---|---|
| NCP170AXV250GEVB | Active | Pb-free | Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board | NCP170BXV250T2G |
Technical Documents
| Type | Document Title | Document ID/Size | Rev |
|---|---|---|---|
| Eval Board: BOM | NCP170AXV250GEVB Bill of Materials ROHS Compliant | NCP170AXV250GEVB_BOM_ROHS.pdf - 15 KB | 0 |
| Eval Board: Gerber | NCP170AXV250GEVB Gerber Layout Files (Zip Format) | NCP170AXV250GEVB_GERBER.zip - 32 KB | 0 |
| Eval Board: Schematic | NCP170AXV250GEVB Schematic | NCP170AXV250GEVB_SCHEMATIC.pdf - 54 KB | 0 |
| Eval Board: Test Procedure | NCP170AXV250GEVB Test Procedure | NCP170AXV250GEVB_TEST_PROCEDURE.pdf - 37 KB | 0 |
| Video | Ultra‐Low IQ 150 mA CMOS LDO Regulator Evaluation Boards - NCP170 | WVD17574/D |
- NCP170AXV250GEVB BOM ROHS NCP170AXV250GEVB
- NCP170AXV250GEVB GERBER NCP170AXV250GEVB
- NCP170AXV250GEVB SCHEMATIC NCP170AXV250GEVB
- NCP170AXV250GEVB TEST PROCEDURE NCP170AXV250GEVB
