SN54ABT8646 具有八路总线收发器和寄存器的扫描测试设备

The ’ABT8646 and scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent to the ’F646 and ’ABT646 octal bus transceivers and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE™ octal bus transceivers and registers

	SN54ABT8646
Voltage Nodes (V)	5
Vcc range (V)	4.5 to 5.5
Input Level	TTL
Output Level	TTL
No. of Outputs	8
Logic	True
Technology Family	ABT
Rating	Military

SN54ABT8646 特性

Members of the Texas Instruments SCOPE™ Family of Testability Products
Compatible With the IEEE Standard 1149.1–1990 (JTAG) Test Access Port and Boundary-Scan Architecture
Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode
SCOPE™ Instruction Set
- IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
- Parallel-Signature Analysis at Inputs With Masking Option
- Pseudorandom Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
- Binary Count From Outputs
- Even-Parity Opcodes
Two Boundary-Scan Cells Per I/O for Greater Flexibility
State-of-the-Art EPIC-IIB™ BiCMOS Design Significantly Reduces Power Dissipation
Package Options Include Plastic Small-Outline (DW) and Shrink Small-Outline (DL) Packages, Ceramic Chip Carriers (FK), and Standard Ceramic DIPs (JT)

SN54ABT8646 芯片订购指南

器件	状态	温度	价格（美元）	封装 \| 引脚	封装数量 \| 封装载体	丝印标记
5962-9458601Q3A	ACTIVE	-55 to 125	59.60 \| 1ku	LCCC (FK) \| 28	1 \| TUBE
5962-9458601QXA	ACTIVE	-55 to 125	38.18 \| 1ku	CDIP (JT) \| 28	1 \| TUBE
SNJ54ABT8646FK	ACTIVE	-55 to 125	59.60 \| 1ku	LCCC (FK) \| 28	1 \| TUBE
SNJ54ABT8646JT	ACTIVE	-55 to 125	38.18 \| 1ku	CDIP (JT) \| 28	1 \| TUBE

SN54ABT8646 应用手册

标题	类型	大小
选择正确的电平转换解决方案 (Rev. A)	PDF	635
Shelf-Life Evaluation of Lead-Free Component Finishes	PDF	1310
Quad Flatpack No-Lead Logic Packages	PDF	1048
Understanding and Interpreting Standard-Logic Data Sheets	PDF	857
TI IBIS File Creation, Validation, and Distribution Processes	PDF	380
Power-Up 3-State (PU3S) Circuits in TI Standard Logic Devices	PDF	209
Implications of Slow or Floating CMOS Inputs	PDF	101
Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs	PDF	105
Advanced BiCMOS Technology (ABT) Logic Characterization Information	PDF	528
Designing With Logic	PDF	186
Advanced BiCMOS Technology (ABT) Logic Enables Optimal System Design	PDF	115
Family of Curves Demonstrating Output Skews for Advanced BiCMOS Devices	PDF	80
Live Insertion	PDF	150
Input and Output Characteristics of Digital Integrated Circuits	PDF	1708
Understanding Advanced Bus-Interface Products Design Guide	PDF	253

SN54ABT8646 质量与无铅数据

器件	环保计划*	铅/焊球涂层	MSL 等级/回流焊峰	环保信息与无铅 (Pb-free)	DPPM / MTBF / FIT 率
5962-9458601Q3A	TBD	Call TI	Call TI	5962-9458601Q3A	5962-9458601Q3A
5962-9458601QXA	TBD	Call TI	Call TI	5962-9458601QXA	5962-9458601QXA
SNJ54ABT8646FK	TBD	POST-PLATE	N/A for Pkg Type	SNJ54ABT8646FK	SNJ54ABT8646FK
SNJ54ABT8646JT	TBD	A42	N/A for Pkg Type	SNJ54ABT8646JT	SNJ54ABT8646JT