The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the 'F374 and 'BCT374 octal D-type flip-flops. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal flip-flops
| SN54BCT8374A | |
| Voltage Nodes(V) | 5 |
| Rating | Military |
| 器件 | 状态 | 温度 | 价格（美元） | 封装 | 引脚 | 封装数量 | 封装载体 | 丝印标记 |
| SN54BCT8374AJ | ACTIVE | -55 to 125 | 4.24 | 1ku | CDIP (J) | 24 | 1 | TUBE |
| 器件 | 环保计划* | 铅/焊球涂层 | MSL 等级/回流焊峰 | 环保信息与无铅 (Pb-free) | DPPM / MTBF / FIT 率 |
| SN54BCT8374AJ | TBD | A42 | N/A for Pkg Type | SN54BCT8374AJ | SN54BCT8374AJ |
